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Beilstein J. Nanotechnol. 2019, 10, 1768–1777, doi:10.3762/bjnano.10.172
Figure 1: (A) Thin polymer film with in situ grown AuNPs (optical path: ca. 350 nm, [Au]/[PVA] mass ratio = 5...
Figure 2: Optical scattering of an expanded laser beam (diameter 5 mm) on the sample. (Left) Undoped polymer ...
Figure 3: Experimental BRDF measurements at θi = −20°and λ = 570 nm. (Left) Non-annealed sample. (Right) Samp...
Figure 4: Scattered intensity in the plane orthogonal to the incidence plane (azimuth 90° or 270°) as a funct...
Figure 5: AFM topography images (Color scale bars in nanometers). (A) PVA matrix with embedded in situ synthe...
Figure 6: Perimeter–area relationship of the AuNPs. Symbols: experimental data determined by using a height-t...
Figure 7: Maps of the ellipsometric angles Ψ and Δ of Au-doped PVA films. (Top) Before annealing. (Bottom) Af...
Figure 8: Statistical distributions of the Ψ angles. (Left) Before annealing. (Right) As function of the anne...
Figure 9: Statistical distribution of the Ψ angles after annealing (t = 120 min). Dashed line: experimental d...
Figure 10: Time evolution of the mean values of ellipsometric angles during annealing. Open squares: Ψ; closed...
Figure 11: Correlation plot between the standard deviation of the ellipsometric angles Ψ and Δ during film ann...
Figure 12: Constant angle of incidence Ψ–Δ curves at the wavelength λ = 658 nm and the angle of incidence θi =...